Role Of Electronic Excitation In The Amorphization Of Ge-Sb-Te Alloys

Xian-Bin Li,X Q Liu,Xin Liu,Dong Han,Z Zhang,X D Han,Hong-Bo Sun,S B Zhang
DOI: https://doi.org/10.1103/PhysRevLett.107.015501
IF: 8.6
2011-01-01
Physical Review Letters
Abstract:First-principles molecular dynamics simulation reveals the effects of electronic excitation in the amorphization of Ge-Sb-Te. The excitation makes the phase change an element-selective process, lowers the critical amorphization temperature considerably, for example, to below 700 K at a 9% excitation, and reduces the atomic diffusion coefficient with respect to that of melt by at least 1 order of magnitude. Noticeably, the resulting structure has fewer wrong bonds and significantly increased phase-change reversibility. Our results point to a new direction in manipulating ultrafast phase-change processes with improved controllability.
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