Linewidth Roughness In Nanowire-Mask-Based Graphene Nanoribbons

Guangyu Xu,Carlos Manuel Torres,Jingwei Bai,Jianshi Tang,Tao Yu,Yu Huang,Xiangfeng Duan,Yuegang Zhang,Kang Wang
DOI: https://doi.org/10.1063/1.3599596
IF: 4
2011-01-01
Applied Physics Letters
Abstract:We present the analysis of linewidth roughness (LWR) in nanowire-mask-based graphene nanoribbons (GNRs) and evaluate its impact on the device performance. The data show that the LWR amplitude decreases with the GNR width, possibly due to the etching undercut near the edge of a nanowire-mask. We further discuss the large variation in GNR devices in the presence of LWR by analyzing the measured transport properties and on/off ratios. (C) 2011 American Institute of Physics. [doi:10.1063/1.3599596]
What problem does this paper attempt to address?