Preparation and growth characterization of crystallized Sr 1-xCaxMoO4 and Sr1-xBa xMoO4 films by chemical solution processing

Yang Liu,Ping Yu,Dingquan Xiao,Yunfei Tian,Xü Liu,YuanLi Li
DOI: https://doi.org/10.1080/00150193.2010.492008
2011-01-01
Ferroelectrics
Abstract:Crystallized solid-solution films, Sr1-xCaxMoO4 and Sr1-xBaxMoO4 (0 <= x <= 1), have been prepared on Si substrates by chemical solution processing. The structure and composition of the films were investigated using X-ray diffraction and Vegard's law. No obvious phase separation was observed when the films were annealed at 650 degrees C. The diffraction peaks position of the films was dependent on the content of Ca, Sr, and Ba in the films, respectively. And the different growing habits caused by the element species and content lead to the different oriented growth of the films.
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