Performance Improvement of Sb2Te3 Phase Change Material by Al Doping

Cheng Peng,Liangcai Wu,Zhitang Song,Feng Rao,Min Zhu,Xuelai Li,Bo Liu,Limin Cheng,Songlin Feng,Pingxiong Yang,Junhao Chu
DOI: https://doi.org/10.1016/j.apsusc.2011.07.072
IF: 6.7
2011-01-01
Applied Surface Science
Abstract:Al doped Sb2Te3 material was proposed to improve the performance of phase-change memory. Crystallization temperature, activation energy, and electrical resistance of the Al doped Sb2Te3 films increase markedly with the increasing of Al concentration. The additional Al-Sb and Al-Te bonds enhance the amorphous thermal stability of the material. Al0.69Sb2Te3 material has a better data retention (10 years at 110 degrees C) than that of Ge2Sb2Te5 material (10 years at 87 degrees C). With a 100 ns width voltage pulse, SET and RESET voltages of 1.3 and 3.3 V are achieved for the Al0.69Sb2Te3 based device. (C) 2011 Elsevier B. V. All rights reserved.
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