Aging-induced abnormality of dielectric response under dc bias in Ba(Zr, Ti)O 3 thin films

C. Gao,J. Yang,X. J. Meng,T. Lin,J. H. Ma,J. L. Sun,J. H. Chu
DOI: https://doi.org/10.1007/s00339-010-6076-3
2010-01-01
Abstract:The dielectric properties of fresh and aged Ba(Zr 0.25 Ti 0.75 )O 3 thin films have been investigated. It is found that the aged sample shows a significant decrease in the dielectric constant compared to the fresh one. Furthermore, the aged sample also exhibits abnormal double-peaks-shape butterfly C–V characteristics, which indicates the defect-dipole stabilized domain and/or domain-wall motions. Meanwhile, we found that double-peaks-shape butterfly C–V characteristics become weak and even disappear with increasing of applied electric field and temperature. The present results are discussed in light of the symmetry-conforming principle of point defects.
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