An Abnormal Dielectric Relaxation Phenomenon Observed In Pbzr(0.38)Ti(0.62)O(3) Multilayers

Gujin Hu,Ting Zhang,HaiJun Bu,JingLan Sun,Junhao Chu,Ning Dai,Da Ming Zhu,Yizheng Wu
DOI: https://doi.org/10.1063/1.3415552
IF: 2.877
2010-01-01
Journal of Applied Physics
Abstract:We report an unusual dielectric relaxation phenomenon associated with dipolar defect complexes Ti(3+)-(V(o2-))(center dot center dot) observed in the PbZr(0.38)Ti(0.62)O(3) multilayers. The dielectric loss aroused by the polarization of defect dipoles varies with time under ac electric fields, and its change can be controlled by an applied dc bias. This abnormally dynamic behavior of dielectric loss can be interpreted by the formation and dissociation of dipolar defect pairs Ti(3+)-(V(o2-))(center dot center dot) by injection of charged carriers. These investigations may be beneficial to getting further insight into the defect dynamics and the mechanism of ferroelectric polarization fatigue and restoration in ferroelectric materials. (C) 2010 American Institute of Physics. [doi:10.1063/1.3415552]
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