Ultrasensitive Near-Infrared Cavity Ring-Down Spectrometer for Precise Line Profile Measurement

Bo Gao,Wei Jiang,An-Wen Liu,Yan Lu,Cun-Feng Cheng,Guo-Sheng Cheng,Shui-Ming Hu
DOI: https://doi.org/10.1063/1.3385675
2010-01-01
Abstract:A cavity ring-down (CRD) spectrometer is built with a continuous-wave Ti:sapphire ring laser. Using a pair of R approximately 0.999 95 high-reflective mirrors, the noise-equivalent minimum detectable absorption loss reaches 7 x 10(-11)/cm over the spectral range of 780-830 nm. A thermal-stabilized Fabry-Perot interferometer is applied to calibrate the CRD spectrum with an accuracy of 1 x 10(-4) cm(-1). The quantitative measurement is carried out for the line profile measurements of some overtone absorption lines of C(2)H(2) near 787 nm. Doppler determined line shape has been observed with milli-Torr acetylene gas in the ring-down cavity. The instrumental line width is estimated from the line profile fitting to be <1 x 10(-4) cm(-1). It demonstrates that the CRD spectrometer with extremely high sensitivity is also very suitable for quantitative measurements including precise line profile studies in the near-infrared.
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