Abstract:We present a new comprehensive mathematical model of the cone-shaped cantilever tip-sample interaction in Atomic Force Microscopy (AFM). The importance of such AFMs with cone-shaped cantilevers can be appreciated when its ability to provide high-resolution information at the nanoscale is recalled. It is an indispensable tool in a wide range of scientific and industrial fields. The interaction of the cone-shaped cantilever tip with the surface of the specimen (sample) is modeled by the damped Euler-Bernoulli beam equation $ \rho_A(x)u_{tt} $ $ +\mu(x)u_{t}+(r(x)u_{xx}+\kappa(x)u_{xxt})_{xx} = 0 $, $ (x, t)\in (0, \ell)\times (0, T) $, subject to the following initial, $ u(x, 0) = 0 $, $ u_t(x, 0) = 0 $ and boundary, $ u(0, t) = 0 $, $ u_{x}(0, t) = 0 $, $ \left (r(x)u_{xx}(x, t)+\kappa(x)u_{xxt} \right)_{x = \ell} = M(t) $, $ \left (-(r(x)u_{xx}+\kappa(x)u_{xxt})_x\right)_{x = \ell} = g(t) $ conditions, where $ M(t): = 2h\cos \theta\, g(t)/\pi $ is the moment generated by the transverse shear force $ g(t) $. Based on this model, we propose an inversion algorithm for the reconstruction of an unknown shear force in the AFM cantilever. The measured displacement $ \nu(t): = u(\ell, t) $ is used as additional data for the reconstruction of the shear force $ g(t) $. The least square functional $ J(F) = \frac{1}{2}\Vert u(\ell, \cdot)-\nu \Vert_{L^2(0, T)}^2 $ is introduced and an explicit gradient formula for the Fréchet derivative of the cost functional is derived via the weak solution of the adjoint problem. Additionally, the geometric parameters of the cone-shaped tip are explicitly contained in this formula. This enables us to construct a gradient based numerical algorithm for the reconstructions of the shear force from noise free as well as from random noisy measured output $ \nu (t) $. Computational experiments show that the proposed algorithm is very fast and robust. This creates the basis for developing a numerical "gadget" for computational experiments with generic AFMs.

Theory of Higher Harmonics Imaging in Tapping-Mode Atomic Force Microscopy

Study of Tip-Sample Contact Process and Phase Contrast in Tapping Mode Atomic Force Microscopy

Simulation and experimental analysis of tip response of tapping mode atomic force microscope

How does a tip tap?

Molecular Dynamics Simulation of Form Measurement Process of Soft Materials Using Atomic Force Microscope

Improved Sensitivity for Subsurface Imaging by Contact Resonance Atomic Force Microscopy Using Fano Peaks

Time-varying tip-sample force measurements confirm steady-state dynamics in tapping-mode atomic force microscopy

Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements

The mechanism of high-resolution STM/AFM imaging with functionalized tips

Manipulation, dissection, and lithography using modified tapping mode atomic force microscope.

Investigation on the Impact of Excitation Amplitude on AFM-TM Microcantilever Beam System's Dynamic Characteristics and Implementation of an Equivalent Circuit

A Horizontal Atomic Force Microscope and Its Applications

The Role of Nonlinear Dynamics in Quantitative Atomic Force Microscopy

"Reported Goals of Instructors of Responsible Conduct of Research for Teaching of Skills".

Subsurface phase imaging of tapping-mode atomic force microscopy at phase resonance

Reconstruction of shear force in Atomic Force Microscopy from measured displacement of the cone-shaped cantilever tip

Effect of lateral tip motion on multifrequency atomic force microscopy

Speculative Attacks and Defenses as Wars of Attrition: Theory and an Example*

Characterization of Nanoscale Vibration Using Tapping Mode AFM

Tapping mode microwave impedance microscopy.

Experimental analysis of tip vibrations at higher eigenmodes of QPlus sensors for atomic force microscopy