Nonlinear Electrical Properties Of Si Three-Terminal Junction Devices

Fantao Meng,Jie Sun,Mariusz Graczyk,Kailiang Zhang,Mika Prunnila,Jouni Ahopelto,Peixiong Shi,Jinkui Chu,Ivan A. Maximov,Hongqi Xu
DOI: https://doi.org/10.1063/1.3526725
IF: 4
2010-01-01
Applied Physics Letters
Abstract:This letter reports on the realization and characterization of silicon three-terminal junction devices made in a silicon-on-insulator wafer. Room temperature electrical measurements show that the fabricated devices exhibit pronounced nonlinear electrical properties inherent to ballistic electron transport in a three-terminal ballistic junction (TBJ) device. The results show that room temperature functional TBJ devices can be realized in a semiconductor material other than high-mobility III-V semiconductor heterostructures and provide a simple design principle for compact silicon devices in nanoelectronics. (C) 2010 American Institute of Physics. [doi:10.1063/1.3526725]
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