Electrical Breakdown Of Zno Nanowires In Metal-Semiconductor-Metal Structure

Qi Zhang,Junjie Qi,Ya Yang,Yunhua Huang,Xin Li,Yue Zhang
DOI: https://doi.org/10.1063/1.3457169
IF: 4
2010-01-01
Applied Physics Letters
Abstract:We investigated the stability of ZnO nanowires in a metal-semiconductor-metal structure by applying a longitudinal electric field inside a scanning electron microscope equipped with manipulators. The electrical transport was well simulated by the thermionic-field-emission model and the failure of single crystalline ZnO nanowires was directly observed when the applied electric field reached the break point, an electric field intensity of similar to 10(6) V/m. The recrystallization of ZnO nanowires from single crystalline to polycrystalline pearl-like structure in the failure process was also investigated. Experimental results indicated that the failure is attributed to a joint effect of high electric field and Joule heating. (C) 2010 American Institute of Physics. [doi:10.1063/1.3457169]
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