Influence of Slenderness Ratio on the Percolation Threshold of Conductive Adhesives

TAO Yu,XIA Yanping,ZHANG Guoqing,WU Xijun,SU Hao,LIANG Pinghui,WU Haiping,TAO Guoliang
DOI: https://doi.org/10.13801/j.cnki.fhclxb.2010.06.010
2010-01-01
Abstract:Nanostructured silver with different slenderness ratio was prepared by a microwave(MW) assisted method.The nano-silvers were characterized by scanning electron microscope(SEM) and X-ray diffraction(XRD).Isotropical conductive adhesive(ICA) was prepared by using the different slenderness ratio nano-silver as the conductive filler.The conductivity of the adhesive was measured by four-points method.The results indicate that the slenderness ratio of the nano-silver has important influence on it's percolation threshold.A feasible modified threshold theory was put forward to simulate the relationship between ratio and threshold.The simulation results agree well with the experimental results.
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