Abstract:With the help of the mean-field approximation under the transverse Ising model,the influence of the thick dielectric film layers on the phase transition properties of the ferroelectric thin films with two surface layers was studied.By treating with the model,a recursive equation for the phase transition properties of the ferroelectric thin film with two surface layers and thick dielectric film layers was obtained.The effects of the exchange interaction and the transverse field of the thick dielectric film layer to the phase diagrams were studied as well.Additionally,the influence of the exchange interaction to the crossover value of the transverse field,and the influence of the transverse field on the crossover value of the exchange interaction were also investigated.The results show that the ferroelectric range,the Curie temperature,and the transverse field of the thick dielectric layers all become large,with the exchange interaction of the thick dielectric layers increase.And the exchange interaction of the thick dielectric layers also become large when its transverse field increases,while the ferroelectric range,the Curie temperature become small with the increasing of the transverse field of the thick dielectric layers.Meanwhile,it is also found that the influence of the exchange interaction of the thick dielectric layers on the whole film is larger than its transverse field.At last,the effect of the exchange interaction of the two surface layers on the phase diagram is also shown.The numerical results will be helpful to the fabrication of the thick dielectric ferroelectric film.

The Effects of the Layer-Dependent Interaction Parameters on the Phase Diagrams and Polarizations of the Ferroelectric Thin Film

Phase Transition Properties of Ferroelectric Thin Films with Two Surface Layers

Parameter modifications in the phase diagrams of the transverse field Ising model

Investigation of the crossover properties for the interaction parameters of a ferroelectric thin film

Effects of Thickness on the Polarization States in Epitaxial Ferroelectric Thin Films

On the Theory of the Effect of the Thick Dielectric Film Layers to Ferroelectric Thin Films with Two Surface Layers

Effects of the Transverse Ising Model Parameters on the Polarizations of Multi-Surface Ferroelectric Thin Films

Study of Defect-Layers Effect in Ferroelectric Thin Film with Transverse Ising Model

PHASE TRANSITION PROPERTIES OF FERROELECTRIC THIN FILM WITH ONE DISTINCT INSERTING-LAYER

Effects Of Unequally Biaxial Misfit Strains On Polarization Phase Diagrams In Embedded Ferroelectric Thin Layers: Phase Field Simulations

Influence Of Depolarization Field On Polarization States In Epitaxial Ferroelectric Thin Films With Nonequally Biaxial Misfit Strains

Size Effects In Epitaxial Ferroelectric Islands And Thin Films

Investigation of the seeding-layer effect for a ferroelectric thin film with the transverse Ising model

A General Analytical Equation for Phase Diagrams of an N-Layer Ferroelectric Thin Film with Two Surface Layers

Polarization Properties of Ferroelectric Thin Films on Transverse Ising Model

Domain Structures and Phase Diagram in 2D Ferroelectrics under Applied Biaxial Strains - Phase Field Simulations and Thermodynamic Calculations

CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES: Study of Phase Transition Properties in Epitaxial Ferroelectric Film

Influence of Lateral Size on Dielectric Properties of Ferroelectric Thin Films with Structure Transition Zones

Green'S Function Approach to Crossover Properties for Interaction Parameters of an N-Layer Ferroelectric Thin Film

Dielectric properties of ferroelectric thin films with surface transition layers.

Study of phase transition properties in epitaxial ferroelectric film