AFM-Based Bending Test of Electrospun PCL Nanofibers

Bo YUAN,Jun WANG,Ping-chou HAN,Shui-de LIN
DOI: https://doi.org/10.16865/j.cnki.1000-7555.2009.05.015
2009-01-01
Abstract:In this paper, results of an atomic force microscopy (AFM)-based 3-point bending test performed on electrospun polycaprolactone (PCL) nanofibers were reported. The fibers had diameters that range from 83 nm-800 nm and samples were collected for testing by randomly depositing them over a silicon wafer lined with 10μm U-channels. Using the AFM tip the precise fiber diameter and the force-deflection curve were measured, and from this information the elastic modulus of the PCL nanofibers were readily determined via the classic beam bending theory. The results show that the fibers exhibit an increasingly enhanced elastic modulus as their diameters are decreased past a threshold value. Our experiments show that it is necessary to consider the obvious size-dependent behavior in PCL fibers when studying their mechanical properties at the nano-scale level.
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