Electrothermal large-signal model of III–V FETs accounting for frequency dispersion and charge conservation

Linsheng Liu,Jianguo Ma,Geoking Ng
DOI: https://doi.org/10.1109/MWSYM.2009.5165805
2009-01-01
Abstract:A comprehensive electrothermal model of III-V FETs is presented which accounts for gate/drain trapping effects and charge conservation. Two improved drain current models with and without transconductance compression mechanism, respectively, along with a consistent charge-conservative gate charge model have been developed. The channel current modeling parameters are extracted from DC and Pulsed I-V measurements at different ambient temperatures and quiescent biasing points. And the validity of the complete large-signal model is demonstrated by comparing the predicted I-V, C-V as well as power characteristics with the measured ones by employing GaAs pHEMTs.
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