Analytical drain current model for long-channel double-gate negative capacitance junctionless transistors using Landau theory

Chunsheng Jiang,Renrong Liang,Jing Wang,Jun Xu
DOI: https://doi.org/10.1109/EDSSC.2016.7785204
2016-01-01
Abstract:An analytical drain current model was proposed for long-channel double-gate negative capacitance junctionless transistors (DG NC JLTs) with a metal-ferroelectric-insulator-semiconductor structure. The analytical model was derived by solving Poisson's equation, Pao-Sah equation and Landau-Khalatnikov equation. It was shown that the off-state current could be significantly lowered and the on-state current could be improved simultaneously by employing the ferroelectric gate dielectric. The related working principle and physical mechanism were also discussed in detail. The proposed model is suitable for the compact modeling because it is valid for the depletion, flat-band and accumulation regions without any auxiliary variables or functions. The developed DG NC JLTs have a great potential for low-power applications.
What problem does this paper attempt to address?