Reliability inference for dual constant-stress accelerated life test with exponential distribution and progressively Type-II censoring
Xuefeng Feng Jiayin Tang N. Balakrishnan Qitao Tan a Department of Statistics,School of Mathematics,Southwest Jiaotong University,Chengdu,People's Republic of Chinab Department of Mathematics and Statistics,McMaster University,Hamilton,Ontario,Canadac China Aerospace Science and Industry Corp,Beijing,People's Republic of China
DOI: https://doi.org/10.1080/00949655.2024.2405848
IF: 1.225
2024-09-26
Journal of Statistical Computation and Simulation
Abstract:Accelerated life test provides a feasible and effective way to rapidly derive lifetime information by exposing products to higher-than-normal operating conditions. However, most of the previous research on accelerated life test has focused on the application of a single stress factor and a traditional censoring scheme. This article considers the reliability inference for a dual constant-stress accelerated life test model with exponential distribution and progressively Type-II censoring. Point estimates for model parameters are provided using maximum likelihood estimation and the weighted least squares method based on random variable transformation. In addition, we construct asymptotic confidence intervals, approximate confidence intervals, and bootstrap confidence intervals for the parameters of interest. Finally, extensive simulation studies and an illustrative example are presented to investigate the performance of the proposed methods.
statistics & probability,computer science, interdisciplinary applications