Abstract:We report in this paper the electric properties of nanostructured copper filament arrays self-organized by a novel electrochemical method. Due to the spontaneous oscillation of the concentration field of [Cu2+ ] in front of the growing interface, crystallites of copper and cuprous oxide appear alternately on the filaments of the electrodeposits. A conducting atomic force microscope (CAFM) and current imaging tunnelling spectroscopy (CITS) were used to characterize the electric properties of the nanostructured copper filaments. By applying a constant voltage across the conducting probe of the CAFM and the sample, an electric current mapping is achieved, in which alternating low and high current regions correspond exactly to the periodic nanostructures on the filaments. The profile of the electric current along the structured filament has been analysed, and no noticeable potential drop has been observed. A typical linear I–V curve for a metal and nonlinear I–V curve for a semiconductor were collected in the high and low current regions respectively. These results suggest that despite the periodic distribution of Cu2O crystallites on the deposited filament, there should exist a metallic core of copper crystallites inside the filament. This type of structured metal–semiconductor filament might have potential application.

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