Application of Petri-net Technique in Modeling of Semiconductor Wafer Fabrication

曹政才,乔非,吴启迪
DOI: https://doi.org/10.3321/j.issn:0253-374x.2008.12.022
2008-01-01
Abstract:The recent research progress of Petri-net-based modeling for semiconductor wafer fabrication is presented,including the important characteristics of semiconductor wafer fabrication,modeling approach,modes of Petri-net,scheduling methods and real application.Finally,the paper presents some problems worthy of further study and probably developing trends in the semiconductor manufacturing field.
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