Temperature-Dependent Transport Properties in Oxide P – N Junction above Room Temperature

Liu Guo-Zhen,Jin Kui-Juan,He Meng,Qiu Jie,Xing Jie,Lu Hui-Bin,Yang Guo-Zhen
DOI: https://doi.org/10.1088/0256-307x/25/6/078
2008-01-01
Abstract:Oxide p – n junctions of p -SrIn0.1Ti0.9O3/n-SrNb0.01Ti0.99O3 (SITO/SNTO) are fabricated by laser molecular beam epitaxy. The current-voltage characteristics of the SITO/SNTO p – n junction are investigated mainly in the temperature range of 300–400 K. The SITO/SNTO junction exhibited good rectifying behaviour over the whole temperature range. Our results indicate a possibility of application of oxide p – n junction in higher temperatures in future electronic devices.
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