Characteristics of Intensity Modulation in Single-Mode Microchip Nd:YAG Lasers with Anisotropic Feedback and Its Applications

Tan Yidong,Zhang Shulian
DOI: https://doi.org/10.1117/12.790871
2007-01-01
Abstract:The characteristic of laser intensity modulation in microchip Nd:YAG lasers with anisotropic feedback is presented, on which a force measurement scheme based is demonstrated. The measurement system is composed of a microchip Nd:YAG laser, a birefringence element (BFE), and an external feedback mirror. Due to the bireffingence effect of BFE, the external cavity modulates the laser intensities in two orthogonal directions with a phase difference (PF), which is twice as large as that of the BFE. If a photoelastic element with force loaded on is served as BFE, the PF between two in-quadrature laser intensities is proportional to the force loaded on the photoelastic element. Thus, the force can be easily and conveniently obtained from the PF between two in-quadrature laser intensities. A theoretical model is put forward and is in good agreement with the experimental results. Moreover, the results here can also be applied to displacement measurement. Our researches broaden the optical feedback in application for precision measurement.
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