Fabrication and Testing of a Silicon-Based Piezoresistive Two-Axis Accelerometer

陈尚,薛晨阳,张文栋,张斌珍,张国军,张开瑞
DOI: https://doi.org/10.3969/j.issn.1672-6030.2008.04.007
2008-01-01
Nanotechnology and Precision Engineering
Abstract:A novel two-axis accelerometer was presented in this paper,which is based on piezoresistive detection.This kind of sensor consists of four vertical cantilever beams with attached cylinder in the center of the sturcture.By locating the resis-tor logically to form the Wheatstone birdge,this sensor can measure the acceleration in two directions.The characteristic of structure’s sensitivity was analyzed by the mechanical model and piezoresistive effect.The accelerometer was fabricated on silicon using MEMS technology,and the geometry dimension,residual stress,frequency response and sensitivity were re-spectively tested by means of microsystem analyzer,laser Raman spectroscopy quantitate-stress system and vibrating table.The experimental results show that the accelerometer has high sensitivity and good linearity in two directions.The sensitivity of the X direction and Y direction is 1.017,4,mV/g and 0.897,61,mV/g,respectively,the linearity of the X direction and Y direction is 0.999,91 and 0.999,45,respectively.The curve of frequency response is straight and smooth,and the measured resonance frequency is about 670,Hz.
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