Simultaneous Phase-Shifting Interferometry Based On High-Speed Ccd

Zuo Fen,Chen Lei,Xu Chunsheng
DOI: https://doi.org/10.1117/12.725441
2007-01-01
Abstract:A new simultaneous phase-shifting measuring method based on Twyman-Green polarization phase-shifting technique is presented. In the corresponding set-up, a 2-dimentional grating is applied. By the grating, 4 diffracted beams of ( I, 0 orders are formed for the same diffracting efficiency. Each is let to pass one of four polarizing plates respectively, polarization directions of which differ in turn by 45 degrees. So four interferograms with 90 degrees phase-shifting interval are frozen simultaneously by a high-speed CCD, which has short exposure of 1/10000 s. Moreover, by the use of 4-bucket algorithm, a profile of the test surface is thus derived. Meantime, the system is deposited on a vibration-isolate flat, and the structure of an ordinary piezoelectric transducer (PZT), with a time response above 1000 Hz at amplitude of lambda/2, is used to simulate an epicenter, the frequency of which varying from 10 Hz to 200 Hz. In addition, the experimental results reveal that the advanced system has a high testing precision and testing repeatability in the vibrational environment whose amplitude-frequency product is less than 100 Wave-Hertz. Therefore, the proposed system has enough endurance to the vibration during on-line optical testing.
What problem does this paper attempt to address?