A 0.41ns CLK-OUT Delay, 0.22mvrms Input-Referred Noise CMOS Integration Dynamic Comparator with Flipping Capacitor for Charge Reuse
Kwok Cheong Li,Xinhang Xu,Jihang Gao,Siyuan Ye,Jiajia Cui,Yacong Zhang,Ru Huang,Linxiao Shen
DOI: https://doi.org/10.1109/lssc.2024.3510389
2024-01-01
IEEE Solid-State Circuits Letters
Abstract:A high-speed and power-efficient CMOS integration dynamic comparator is presented. Low input-referred noise is accomplished by CMOS integration. To achieve low power consumption, a charge-reusing scheme by flipping the flying capacitors across the PMOS/NMOS integration nodes is introduced. The 22nm prototype achieves a 0.22mVrms input-referred noise with an energy consumption of 227fJ per conversion, which is improved by 2x compared with the StrongARM counterpart in the same process. Furthermore, with the latch stage embedded, the achieved 0.41ns CLK-OUT delay shows an over 20x improvement compared with the existing works with CMOS integration.