Complicated Subthreshold Behavior of Undoped Cylindrical Surrounding-Gate MOSFETs

Wei Bian,Jin He,Yu Chen,Yue Fu,Rui Zhang,Lining Zhang,Mansun Chan
DOI: https://doi.org/10.1109/EDSSC.2007.4450193
2007-01-01
Abstract:This paper studied the complication of sub-threshold slope and threshold voltage of undoped Surrounding-Gate (SRG) MOSFETs based on a rigorous classical channel potential model. The detail theoretical analysis demonstrates that the sub-threshold behavior of SRG MOSFETs strongly depends on the silicon body radius. The ideal sub-threshold slope factor S = 60 mV/Dec only appears when the body radius is smaller than a critical value. With a larger silicon body radius, a dual sub-threshold slope factor is displayed. The complex sub-threshold behavior of SRG MOSFETs complicates the definition and extraction of the threshold voltage, which has also been studied in this paper.
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