Abstract:It is known that the complexity of automatic test pattern generation (ATPG) for acyclic sequential circuits is similar to that of combinational ATPG. The general problem, however, requires time-frame expansion and multiple-fault detection and hence does not allow the use of available combinational ATPG programs. The first contribution of this work is a combinational single-fault ATPG method for the most general class of acyclic sequential circuits. Without inserting any real hardware, we create a functionally equivalent “balanced” ATPG model of the circuit in which all reconverging paths have the same sequential depth. Some primary inputs and gates are duplicated in this model, which is converted into a combinational circuit by shorting all flip-flops. A test vector obtained by a combinational ATPG program for a fault in this combinational circuit is transformed into a test sequence to detect a corresponding fault in the original sequential circuit. A combinational ATPG program finds tests for all but a small set of faults that must be explicitly detected as multiple-faults. Those are modeled for ATPG using the second contribution of this work, which is a generalized method to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most $n+3$ modeling gates for a fault of multiplicity $n$. We show that the modeled circuit is functionally equivalent to the original circuit and the targeted multiple fault is equivalent to the modeled single stuck-at fault. Benchmark results show at least an order of magnitude saving in the ATPG CPU time by the new combinational method over sequential ATPG.

Test Generation for Non-Synchronous Sequential Circuit

A Test Generation Approach For Non-Synchronous Sequential Circuit

Sequential circuit ATPG using combinational algorithms

Test generation for cyclic combinational circuits

Non-Scan Design for Testability for Synchronous Sequential Circuits Based on Conflict Analysis

Testability Prediction for Sequential Circuits Using Neural Network

Nonscan Design for Testability for Synchronous Sequential Circuits Based on Conflict Resolution

Generating External Synchronizable Test Sequences That Detect Output-Shifting Faults

Automatic generation of synthetic sequential benchmark circuits

Test Sequence Generation for Distributed Software System.

A New Method of Test Generation for Combinational Circuits

Non-Scan Design For Testability For Synchronous Sequential Circuits Based On Fault-Oriented Conflict Analysis

Combinational automatic test pattern generation for acyclic sequential circuits

Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown

Design of Mixed Synchronous/Asynchronous Systems with Multiple Clocks.

A new approach to test generation for combinational circuits

Test Pattern Merging Algorithms for Sequential Circuits

Partial Reset for Synchronous Sequential Circuits Using Almost Independent Reset Signals

A Combination of Partial Reset and Observation Point Insertion for Synchronous Sequential Circuits

Initialization for synchronous sequential circuits based on particle swarm optimization algorithm

Towards Interoperability Test Generation of Time Dependent Protocols: a Case Study.