Abstract:Based on the twisting-ring counter(TRC) and linear feedback shift register(LFSR),a kind of test pattern generator,which can realizes two-dimensional test pattern compression is presented.The proposed approach utilizes the test set embedding technique based on TRC and LFSR reseeding schemes to achieve the vertical and horizontal compressions of the test set,which significantly reduces the width and length of the deterministic test set.Theoretical analysis shows that the length of LFSR of the design is reduced up to s max+2 from s max+20,which increases the encoding efficiency.In order to target the minimization of the number of the LFSR seeds,an efficient LFSR seed selection algorithm is then proposed.Here,each LFSR seed is decoded as a TRC seed,and then,the TRC seed generates 2n2+n test patterns.Experimental results for the ISCAS89 benchmark circuits show that the proposed scheme requires 69% less test data storage compared with previous schemes,and that the test control logic is simple for all CUTs,and can be shared among multiple CUTs.

A Test Set Compression Algorithm Based on Variable-Run-Length Code

Test Data Compression for System-on-Chip Using Advanced Frequency-Directed Run-Length(AFDR) Codes

A Power Efficient Test Data Compression Method for SoC Using Alternating Statistical Run-Length Coding

A Compressive-sensing based Testing Vehicle for 3D TSV Pre-bond and Post-bond Testing Data.

A new test data compression/decompression scheme to reduce SOC test time

A Power Efficient Test Data Compression Method on Count Compatible PRL Coding

An Efficient Compatibility-Based Test Data Compression and Its Decoder Architecture.

A Test Data Compression Method for System-on-a-Chip

Test Data Compression for System-on-a-Chip using Count Compatible Pattern Run-Length Coding

A Test Set Compression Algorithm Based on PTIDR Code

VSPTIDR: A novel code for test compression of SoC

Locally optimum run-length compression of CT images without restriction on the pixel value

Test data compression using extended frequency-directed run length code based on compatibility

A Simple and Effective Data Compress Algorithm in Wireless Sensor Networks

Compression Method Based on Test Vector Compatibility

Non-intrusive Test Compression for SOC Using Embedded FPGA Core

The Algorithm of Filling X Bits in Dual-Run-Length Coding

Test Data Compression for System-on-chip Using Flexible Runs-aware PRL Coding.

Test Resource Partitioning Using PTIDR Code

RunBasedReordering: A Novel Approach for Test Data Compression and Scan Power

Design of the 2-dimensional test patten compression based on TRC-LFSR structure