Microstructures and Properties of Tantalum Film Grown by DC Magnetron Sputtering

Jiangtao Cui,Xiangli Liu,Xiubo Tian,Xindong Hu,Shiqin Yang
DOI: https://doi.org/10.3969/j.issn.1672-7126.2007.03.019
2007-01-01
Abstract:Microstructures and mechanical properties of the tantalum films, grown by DC magnetron sputtering, were characterized with X-ray diffraction (XRD), scanning electron microscopy (SEM) and atomic force microscopy (AFM). The dominant phases are found to be α(bcc) and β(tetragonal) in the films. The results show that the pressure and sputtering current strongly affect the phase structures and mechanical properties of the films. For example, under the given film growth conditions, (0.65 Pa and 0.6 A), single-phased, α(bcc), tantalum films can be grown with (110) preferential growth orientation. Large sputtering current results in reduction of β-phase and randomly distributed α-phase. As the pressure and current increase, its micro-hardness increases, its surface roughens, and its wear-resistance decreases.
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