Abstract:Many applications, such as multi-standard wireless and event-driven IoT devices, demand high-resolution ADCs with scalable sampling rate and power consumption. The conventional pipelined ADC can achieve high resolution, but its power does not scale well with the sampling rate due to the use of a closed-loop static OTA for residue amplification. While the OTA can be turned off to save power, it requires considerable time for the bias circuit and CMFB loop to settle when waking up, leading to wasted power and reduced peak operation frequency. Using an open-loop dynamic amplifier can make power scale linearly with frequency, but its gain varies with PVT and often requires background calibration, which converges slowly and is incompatible with event-driven applications. The ring-amp is a promising solution as it features closed-loop operation, easy duty-cycling, and decaying power over time [1]-[4]. However, its stability depends on the dead zone size, which typically requires trimming across PVT variations. Besides, the 1st stage has a constant operating point during amplification, which consumes considerable energy. A recent work proposed a 2-stage floating inverter amplifier (FIA) that is fully dynamic and works in closed-loop [5]. It guarantees stability and does not need dead zone control. Moreover, the power consumptions of all stages decay over time naturally. Nevertheless, its low open-loop gain of 33dB is inadequate for a high-resolution pipelined ADC, and its fast-quenching 2 <sup>nd</sup> stage reduces the amplifier speed, limiting the usage in high-speed designs.

A Low-Power, High-Speed Open-Loop Residue Amplifier for Pipelined ADCs with Digital Calibration

Modeling of a 14-bit, 100-MS/s pipelined ADC with digital nonlinearity calibration

A Fast Combination Calibration of Foreground and Background for Pipelined ADCs

A Low Power 12-Bit 40ms/s Pipelined ADC with Digital Calibration

A 14bit 500MS/s 85.62dBc SFDR 66.29dB SNDR SHA-less pipelined ADC with a stable and high-linearity input buffer and aperture-error calibration in 40nm CMOS

A Calibration Scheme for a 800-Ms/s 14 Bit Pipelined ADC in 28-Nm CMOS

A Maximum-Likelihood-Estimation-Based Digital Background Calibration Technique for Interstage Gain Error in Pipelined ADCs

A 14-bit 500MS/s and 1GS/s Configurable Pipelined ADC with Background Calibration

A High Performance Low Power 12-Bit 40ms/s Pipelined ADC

A Fast and Cost-Effective Calibration Strategy of Inter-Stage Residual Amplification Errors for Cyclic-Pipelined ADCs

A Low-Power Low-Cost On-Chip Digital Background Calibration for Pipelined ADCs.

An Efficient Calibration Technique for Pipeline ADC.

A Comprehensive Digital Calibration for Pipelined ADCs Using Cascaded Nonlinearity Correction

A 10-bit 20-Msample/s 49mW CMOS pipelined A/D converter

A Robust and Simple Two-Mode Digital Calibration Technique for Pipelined ADC

A 48-Mw, 12-Bit, 150-Ms/s Pipelined ADC with Digital Calibration in 65nm CMOS

A 16 Bit 125 MS/s Pipelined Analog-to-Digital Converter with a Digital Foreground Calibration Based on Capacitor Reuse

A 2.9-mW 11-b 20-MS/s pipelined ADC with dual-mode-based digital background calibration

A 0.4-to-40MS/s 75.7dB-SNDR Fully Dynamic Event-Driven Pipelined ADC with 3-Stage Cascoded Floating Inverter Amplifier

A 14-Bit Pipelined ADC with Digital Background Nonlinearity Calibration.

Resistive Degeneration Linearization Dynamic Residue Amplifiers for Pipelined ADCs