FE-based equivalent circuits for simulating transformer internal faults

Hu Guanzhong,Yao A O Yingying,Ni I. Guangzheng,Yang Shiyou,Xie I E Junpeng
DOI: https://doi.org/10.1109/CEFC-06.2006.1633050
2006-01-01
Abstract:A simple and efficient model is proposed to detect transformer internal faults. The winding's structure is preciously simulated for FEM. It is easy to be used for a transformer with internal turn-ground and turn-turn fault. Energy perturbation method is employed to calculate the equivalent circuit parameters of the transformer. With these parameters, state equations can be established to study the relationship among the terminal currents, flux and the fault locations. Through test of a transformer, it reveals that the method is reasonable and effective. © 2006 IEEE.
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