Interface Structure and Phase of Epitaxial SrTiO3 (110) Thin Films Grown Directly on Silicon

JH Hao,J Gao,Z Wang,DP Yu
DOI: https://doi.org/10.1063/1.2061859
IF: 4
2005-01-01
Applied Physics Letters
Abstract:The interface structure and phase between SrTiO3 (110) on Si (100) have been investigated using high-resolution transmission electron microscopy and x-ray photoelectron spectroscopy. The SrTiO3∕Si interface was found to be epitaxially crystallized without any amorphous oxide layer. The formation of Sr silicate at the interface was suggested by considering the fact of the core-level spectra of the Si 2p, O 1s, and Sr 3d. Our results suggest that the presence of a coincident site lattice at the interface between Si and a Sr silicate and/or SrTiO3 may help to stabilize SrTiO3 in the epitaxial orientation reported in the work.
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