EFFECT OF SiO2 NANO-PARTICLES ON ADHESION STRENGTH OF COPPER CONDUCTIVE ADHESIVES

梁彤祥,马文有,曹茂盛
DOI: https://doi.org/10.3321/j.issn:1000-7555.2005.01.056
2005-01-01
Abstract:Copper conductive adhesives were prepared using epoxy as matrix, the mixture of m-phenylenediamine and diaminodiphenylmethane as hardener, and copper particles as the conducting filler. The effect of curing temperature, curing time, hardener content and SiO_2 nano-particles on the adhesion strength was investigated. The adhesion strength reached 20 MPa when the adhesives cured at 145 ℃ for 2 h. The adhesion strength increased to 25 MPa when the SiO_2 nano-particles were doped. This result is attributed to the fact that SiO_2 nano-particles disperses in the molecular chain of epoxy, which absorbs stress and energy, prevents the spreading of crack.
What problem does this paper attempt to address?