Abstract:Polymeric, soft, and biological materials exhibit viscoelasticity, which is a time dependent mechanical response to deformation. Material viscoelasticity emerges from the movement of a material's constituent molecules at the nano- and microscale in response to applied deformation, and viscoelastic properties therefore depend on the speed at which a material is deformed. Recent technological advances, especially in atomic force microscopy (AFM), have provided tools to measure and map material viscoelasticity with nanoscale resolution. However, to understand more about the viscoelastic behavior of a material from such measurements, theoretical grounding during data analysis is required. For example, commercially available bimodal AFM imaging maps two different viscoelastic properties of a sample, the storage modulus, E′, and loss tangent, tanδ, with each property being measured by a different resonance frequency of the AFM cantilever. While such techniques provide high resolution maps of E′ and tanδ, the different measurement frequencies make it difficult to calculate key viscoelastic properties of the sample such as: the model of viscoelasticity that describes the sample, the loss modulus, E′′, at either frequency, elasticity E, viscosity η, and characteristic response times τ. To overcome this difficulty, we present a new data analysis procedure derived from linear viscoelasticity theory. This method is applied and validated by performing amplitude modulation-frequency modulation (AM-FM) AFM, a commercially available bimodal imaging technique, on a styrene-butadiene rubber (SBR) with known mechanical behavior. The new analysis procedure correctly identified the type of viscoelasticity exhibited by the SBR and accurately calculated SBR E, η, and τ, providing a useful means of enhancing the amount of information gained about a sample's nanoscale viscoelastic properties from bimodal AFM measurements. Additionally, being derived from fundamental models of linear viscoelasticity, the method can be employed for any technique where different viscoelastic properties are measured at different and discrete frequencies with applied deformations in the linear viscoelastic regime of a sample.

Measuring and Analyzing Elastic Modulus of Single Voxels by Femo-Second Two-Photon Photopolymerization

Calculating the Elastic Modulus of Single Voxels by Finite Element Analysis

Study of Elastic Modulus and Yield Strength of Polymer Thin Films Using Atomic Force Microscopy

Characterizing viscoelastic properties of thin elastomeric membrane

A Systematic Method for Characterizing the Elastic Properties and Adhesion of a Thin Polymer Membrane

Simultaneous measurement of the Young's modulus and the Poisson ratio of thin elastic layers

A Novel Nano-Spherical Tip for Improving Precision in Elastic Modulus Measurements of Polymer Materials via Atomic Force Microscopy

Biomechanical Analysis of Yeast Cell Based a Piezoresistive Cantilever Sensor

Cell Visco-Elasticity Measured with Afm and Vertical Optical Trapping at Sub-Micrometer Deformations

Using the Adhesive Interaction Between Atomic Force Microscopy Tips and Polymer Surfaces to Measure the Elastic Modulus of Compliant Samples

Cell Visco-Elasticity Measured with Afm and Optical Trapping at Sub-Micrometer Deformations

Enhancing Nanoscale Viscoelasticity Characterization in Bimodal Atomic Force Microscopy

Determination for the Elastic Modulus of the PMMA Thin Film

Study on the Viscoelastic Properties of the Epoxy Surface by Means of Nanodynamic Mechanical Analysis

Elastic Property Characterization of Soft Substrate-Supported Thin Films Using Multiscale Digital Image Correlation

Time-multiplexed laser self-mixing sensor for measurement of multiple material elastic moduli

Analysis of the influence factors on the measurement of elastic modulus using the microcantilever deflection on a nanoindenter

Quantitative Visualization of the Nanomechanical Young’s Modulus of Soft Materials by Atomic Force Microscopy

Analysis of vibrating mode scanning polarization force microscope

Characterization on the Viscoelastic Property of PDMS in the Frequency Domain

Standardized Nanomechanical Atomic Force Microscopy Procedure (SNAP) for Measuring Soft and Biological Samples