Measurement of the Nonlinear Refraction Index of Nd:YVO4 Crystal by Single-beam Z Scan

Jun GUAN,Xia Li,Guanghua Cheng,Guofu Chen,Xun Hou
2005-01-01
Abstract:In this measurement of the nonlinear refraction index of 4 mm thick Nd:YVO4 crystal, the single-beam Z scan method is employed and the experimental data is processed according to the Z scan theory of thin sample. As a result, the refraction index, which tallies with the one resulting from other different measure method, is obtained in this measurement. So the rationality and the validity of this simple measurement and data processing method are proved.
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