Resonance-enhanced multiphoton ionization in the x-ray regime
Aaron C. LaForge,Sang-Kil Son,Debadarshini Mishra,Markus Ilchen,Stephen Duncanson,Eemeli Eronen,Edwin Kukk,Stanislaw Wirok-Stoletow,Daria Kolbasova,Peter Walter,Rebecca Boll,Alberto De Fanis,Michael Meyer,Yevheniy Ovcharenko,Daniel E. Rivas,Philipp Schmidt,Sergey Usenko,Robin Santra,Nora Berrah
DOI: https://doi.org/10.1103/PhysRevLett.127.213202
2021-11-06
Abstract:Here, we report on the nonlinear ionization of argon atoms in the short wavelength regime using ultraintense x rays from the European XFEL. After sequential multiphoton ionization, high charge states are obtained. For photon energies that are insufficient to directly ionize a $1s$ electron, a different mechanism is required to obtain ionization to Ar$^{17+}$. We propose this occurs through a two-color process where the second harmonic of the FEL pulse resonantly excites the system via a $1s \rightarrow 2p$ transition followed by ionization by the fundamental FEL pulse, which is a type of x-ray resonance-enhanced multiphoton ionization (REMPI). This resonant phenomenon occurs not only for Ar$^{16+}$, but through multiple lower charge states, where multiple ionization competes with decay lifetimes, making x-ray REMPI distinctive from conventional REMPI. With the aid of state-of-the-art theoretical calculations, we explain the effects of x-ray REMPI on the relevant ion yields and spectral profile.
Atomic Physics,Optics