Abstract:In studies investigating the interaction of matter with ultraintense, ultrashort x-ray free electron laser (XFEL) pulses, the evolution kinetics are generally described by directly solving a time-dependent rate equation that considers single-photon and single-electron processes. In the present study, we show the effects of single-photon double photoionization and direct double Auger decay in the K-shell ionization kinetics of XFELs interaction with argon atoms. Because a huge number of coupled transition channels are present in the K-shell ionization, we develop a Monte Carlo method to simulate the complex ionization kinetic processes and give the level population evolution of ions and charge state distribution (CSD). The K-shell-dominated ionization dynamics of Ar irradiated by XFEL pulses with photon energies of 5000, 5500 and 6500 eV are investigated and compared with available experimental observations of the CSD. The results show that the population fractions of Ar5+, Ar6+ and Ar9+ are increased by 78%, 152% and 144%, respectively, by these higher-order processes at a photon energy of 5000 eV. Including the direct double-electron processes, the predicted CSDs are in better agreement with the experiments carried out at the photon energies of 5000, 5500 and 6500 eV. It is expected that the developed theoretical formalism can be used to more accurately calibrate the beam profile and intensity of XFELs.

Time-resolved spectra of 240 nm at argon third continuum and kinetics analysis

Resonator Effects of Ar2+ Ionic Excimer Pumped by Electron Beam

Resonator Effects of the Third Continuum of Argon at 240 Nm

Experimental Observation of the Optical Resonator Effect around 260 nm Central Spectral Region in the Third Continuum of Argon

Kinetics on Ar2 + ionic excimer pumped by electron beam

Ion-beam excitation of liquid argon

Study on the Optimum Conditions of the Third Continuum of Argon Pumped by Electron Beam

Laser Oscillation from Argon Ionic Excimer

Interplay Between Single-Photon Ionization and the Auger Process in Argon Ion Formation

Determination of the Rate Coefficient of the Electron-Impact Excitation from the Argon Resonance States (1s2and 1s4) to 2p States by the Emission Line Ratio in an Afterglow Plasma

Attosecond Time-Resolved Autoionization of Argon

Optically Forbidden Excitations of 3s Electron of Argon by Fast Electron Impact

Measurement of the Electron-Impact Excitation Rate Coefficients from Argon 1s States to 3p States

Determination of the Rate Coefficients of the Electron-Impact Excitation from the Metastable States to 2p States of Argon by the Emission Line Ratios in an Afterglow Plasma

Effects of Single-Photon Double Photoionization and Direct Double Auger Decay on K-shell Ionization Kinetics of Ar Atoms Interacting with XFEL Pulses

Measurement and Calculation of the Small Signal Gain Coefficients of the Third Continuum of Argon

Ion Transport Measurements in A Multi-Dipole Argon Plasma by Broadband Laser Induced Fluorescence

Measurement of the temporal evolution of electron density in a nanosecond pulsed argon microplasma: Using both Stark broadening and an OES line-ratio method

Intense Vacuum-Ultraviolet and Infrared Scintillation of Liquid Ar-Xe Mixtures

Characterisation of a 3 nanosecond pulsed atmospheric pressure argon microplasma

Attosecond Time-Resolved Autoionization