Machine Learning Methodologies to Predict the Results of Simulation-Based Fault Injection
Li Lu,Junchao Chen,Markus Ulbricht,Milos Krstic
DOI: https://doi.org/10.1109/tcsi.2024.3349928
2024-01-01
Abstract:Simulation-based fault injection is a widely used technique for early-stage circuit reliability analysis. However, it consumes significant time, particularly for complex circuits. This paper introduces two Machine Learning (ML) methodologies to predict simulation-based fault injection outcomes at the gate level. The initial approach employs Neural Networks (NNs), extracting structural features from synthesis reports and simulation-related characteristics from Value Change Dump (VCD) waveforms. Nevertheless, NNs are restricted to learning from individual gate attributes. To exploit the comprehensive structure of entire circuits, we propose a method to convert circuits into graphs. This facilitates the utilization of Graph Neural Networks (GNNs) as advanced models, resulting in improved prediction performance. We select six open-source circuits with diverse complexities and functions to validate these methodologies and explore their adaptability across various circuits. Our experiments demonstrate the superior performance of GNNs compared to NNs in terms of prediction accuracy, efficiency in hyperparameter search, and the ability to address imbalanced datasets. Additionally, we investigate the feasibility of deploying the trained models to predict results in new circuits. Based on the experimental outcomes, we present an approach for leveraging the proposed methodology to accelerate simulation-based fault injection.
engineering, electrical & electronic