Generating Test Inputs for Embedded Control Systems

QC Zhao,BH Krogh,P Hubbard

DOI: https://doi.org/10.1109/mcs.2003.1213603

2003-01-01

IEEE Control Systems

Abstract:Embedded control systems are growing rapidly, and there is a need for short design cycles. As a result, there is increasing interest in effective methods for automatic test generation. The authors present a new method for leveraging existing simulation models, involving genetic algorithms, for embedded control system designs to generate test inputs automatically, thereby eliminating the time-consuming task of creating them manually.