Experimental Evidence of Interface-Trap-Related SILC in Ultrathin (4nm- and 2.5nm-Thick) n-MOSFET and p-MOSFET Under Hot-Carrier Stress

Guoyong Yang,Zongliang Huo,Jinyan Wang,Lingfeng Mao,Ziou Wang,Changhua Tan,Mingzhen Xu
DOI: https://doi.org/10.3969/j.issn.1674-4926.2003.06.004
2003-01-01
Abstract:Stress-induced leakage current (SILC) of ultrathin gate oxide is investigated by observing the generation of interface traps for n-MOSFET and p-MOSFET under hot-carrier stress.It is found experimentally that there is linear correlation between the generation of interface traps and SILC for both types of MOSFET with different channel lengths (including 1,0.5,0.275,and 0.135μm) and different gate oxide thickness (4nm and 2.5nm).These experimental evidences show that the SILC has a strong dependence on interface traps.
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