Analysis of 42 Major and Trace Elements in Glass Standard Reference Materials by 193nm LA-ICPMS.

XM Liu,S Gao,HL Yuan,B Hattendorf,D Gunther,L Chen,SH Hu
DOI: https://doi.org/10.3969/j.issn.1000-0569.2002.03.017
2002-01-01
Abstract:Four major elements (Na, Mg, Ti and Mn) and thirty-eight trace elements covering nearly the entire mass range from Li-7 to U-238 in four USGS (United State Geological Survey) glass standard reference materials BCR-2G, BHVO-2G, BIR-1G and AGV-2G, and three NIST (National Institute of Standard and Technology) synthetic silicate glass standard reference materials NIST610, NIST612 and NIST614 are analyzed by ICP-MS coupled with a 193nm ArF excimer laser ablation system. The relative standard deviations (RSDs) and relative deviations (RDs) of obtained average concentrations from the reference values are mostly less than 10% for all these USGS and NIST glasses except AGV-2G. Significant exceptions occur for elements with very low concentrations. The RSDs of REEs suggest that these glasses are homogeneous on a scale of 60mum except AGV-2G. Our study demonstrates the suitability of this technique for quantitative major, minor and trace element analysis up to at least several weight percent due to a wide linear dynamic range of 10(8)cps (counts per second) in ICP-MS.
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