Deformation Measurement of Conducting Polythiophene Thin Films by an Electronic Speckle Pattern Interferometric Method

XS Wang,JX Zhang,SQ Zhu,GQ Shi
2002-01-01
Acta Mechanica Solida Sinica
Abstract:The deformation measurement of electrosynthesized polythiophene (Pth) thin films is difficult because of the small thickness and high flexibility of the specimen. An electronic speckle pattern interferometry (ESPI) method is used to measure the deformation of Pth films of thicknesses in the range of 4 - 65 mum. Their stress-strain curves are obtained. It is found that the mechanical properties of Pth films are sensitive to the specimen thickness. The tensile strength increases with decreasing thickness of thin fibre from 10 mum. The influence of the electrochemical synthesis conditions on the mechanical properties of Pth films is also discussed.
What problem does this paper attempt to address?