Local Structures of UltraThin Pt Films Probed by Grazing Incidence Fluorescence XAFS
Zhi Xie,Isao Kojima,Yaning Xie,Bo He,Dongliang Chen,Tao Liu,Tiandou Hu,Xinyi Zhang,Shiqiang Wei
DOI: https://doi.org/10.1238/physica.topical.115a00784
2004-01-01
Nuclear Techniques
Abstract:The local structures of Pt thin films with thicknesses from 3 to 105 nm grown at 298 K have been studied by grazing incidence fluorescence XAFS technique. The results indicate that the bond length R = 2.77 Å and coordination number N = 12.0 of the first shell around Pt atoms in the Pt (105 nm) and Pt (30 nm) thin films are the same as those in Pt foil, except that the disorder degree σ increases by about 8%. The magnitude peaks (located at 2.77, 3.92, 4.80 and 5.55 Å) appearing in the radial distribution function curves suggest that the Pt (105 nm) and Pt (30 nm) thin films keep a long-range order. With thickness decreasing from 105 to 10 nm, the Debye–Waller factor σ2 increases to 6.4 × 10−3 Å2 (σ2 = 4.8 × 10−3 Å2 for the Pt foil). For the Pt (3 nm) ultra-thin film, R1, N1 and σ12 are 2.78 Å, 10.1 and 7.1 × 10−3 Å2, respectively. This implies that N1 largely decreases and σ12 strongly increases in the Pt (3 nm) ultra-thin film. Moreover, its magnitude peaks of the higher shells in the radial distribution function disappear for the Pt (3 nm) ultrathin film. This result shows that the Pt lattice is largely distorted and the medium-range order around Pt atoms is completely destroyed for the Pt (3 nm) ultra-thin film. We consider that the Pt lattice distortion of the Pt ultra-thin film originates from both interaction between Pt particles and SiO2 substrate, and Pt grains with a smaller size forming a surface structure defect.