Analysis of fluorescent and Raman spectra with spatial resolution (depth analysis) method

Xiaoxuan Xu,Jiyou Wang,Jianxin Zhu,Cunzhou Zhang,Guangyin Zhang
DOI: https://doi.org/10.3321/j.issn:1001-9014.2001.03.003
2001-01-01
JOURNAL OF INFRARED AND MILLIMETER WAVES
Abstract:A depth analysis spectra method for researching fluorescent and Raman spectra was developed since a self-absorption was often observed in fluorescent spectra of thick solid sample. The intensity change of self-absorption could be observed to explore the secrets of solid state spectra by depth analysis method. The Raman and fluorescent spectra of Nd3+:YAG crystal were measured with 633nm of HN laser and 514. 5nm of Ar+ laser. Some fluorescent lines which possess self-absorption were observed, whose intensity changes with depth of confocal plane. It shows that spatial resolution (depth analysis) method is a powerful experimental means for studying solid state spectroscopy.
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