Room temperature UV emission of MgxZn1-xO films

YanBo Jin,Bei Zhang,Shuming Yang,Yongzhong Wang,Jing Chen,Huizhen Zhang,Chunhui Huang,ChangQi Cao,Hui Cao,Robert P H Chang
DOI: https://doi.org/10.1016/S0038-1098(01)00244-7
IF: 1.934
2001-01-01
Solid State Communications
Abstract:II–VI wide band-gap semiconductor ternary MgxZn1−xO nanocrystalline films have been successfully formed on conductive glass from ZnO powder by electrophoresis deposition (EDP). In comparison with ZnO powder, the MgxZn1−xO films presented a more preferential crystalline orientation. Room temperature (RT) PL spectra of MgxZn1−xO films revealed a stronger band-edge ultraviolet (UV) emission and a narrower FWMH of 13nm than that of ZnO powder. The UV emission peak of MgxZn1−xO film is located at the range of 375–381nm with a small blue shift from that of ZnO powder. In addition, the ratio of PL peak intensity of band-edge emission to the deep-level emission in MgxZn1−xO films reached as high as 135:1 while compared with 23:1 of ZnO powder under the same He–Cd laser excitation level. Consequently, these electrophoretic deposition (EPD) MgxZn1−xO films exhibited a good quality for excitonic emission at RT.
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