Sheath Sealing in Plasma Immersion Ion Implantation of Spherical Target

Tian Xiubo,K.Chu Paul
DOI: https://doi.org/10.13922/j.cnki.cjovst.2001.02.005
2001-01-01
Abstract:It is of great practical importance to predict the sheath evolution during plasma immersion ion implantation (PIII)of spherical targets in order to properly design the vacuum chamber and treatment processes.However,owing to non-linearity,it is difficult to solve the Child-Langmuir equation to elucidate the sheath dynamics directly in pracitical circumstances.In this paper, sheath scaling for PIII into a spherical target is investigated using numerical methods.Our results demonstrate that the sheath thickness,including the initial ion-matrix sheath and final steady-state sheath,increases with the increase of the spherical radius or applied voltage,and decreases with increasing plasma density.The sheath scale varies to a different degree with respect to parameter change for different processing conditions.For a high plasma density and low applied voltage,the steady-state sheath thickness is more or less insensitive to variations in the spherical radius,but it is very sensitive under other conditions.The ratio of the ion-matrix sheath thickness of a planar target to that of a spherical target depends considerably on the plasma density and the spherical radius.In fact,the steady-state sheath thickness of a planar target is more than that of a spherical target regardless of changes in the plasma density or target size.Our results are important to the design of practical PIII processes.
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