VLSI Design Automation Procedure to Optimize SSN Performance

徐栋麟,郭新伟,徐志伟,林越,任俊彦
DOI: https://doi.org/10.3321/j.issn:0372-2112.2001.11.008
2001-01-01
Abstract:The effects of Simultaneous Switching Noise on VLSI have been elaborated.And an automatic CAD tool to optimize SSN performance of VLSI has been developed with optimized placement of inserting ground pads.Under the conditions provided by this paper,the equations in this procedure can be used in a very high-speed environment.A set of test chips taped out by using this CAD tool proved the procedure can effectively reduce the SSN,which is more serious when feature size of VLSI is scaled down.
What problem does this paper attempt to address?