An application of scanning thermal microscopy: mapping near field light-emission of a QW laser diode in operation

Zhigang Xie,Li Han,Feng Wei,Xiufeng Wang,YuQin Gu,Haoming Chen

DOI: https://doi.org/10.1016/S0921-5093(00)01007-8

2000-01-01

Abstract:Scanning thermal microscopy (SThM) was developed to map the sub-micron temperature distribution. The SThM tip was used as a force probe and thermal sensor simultaneously. In this paper, the tip–sample heat conduction mechanism was explored basing on experiments. It was reported that the dominant mechanism of tip–sample heat conduction was through a water film that bridged the tip–sample junction. We observed that thermal signal varied with the tip–sample distance. There was a sudden drop-off in thermal signal as the tip was pulled off from the water film and thermal signal was relatively insensitive to surface temperature when the tip was lifted to some height. On SThM, imaging of a commercial quantum-well-laser diode emitting at 980 nm has been performed. By comparing thermal images achieved in Contact mode and that in the Lift mode, we could distinguish between the surface temperature signal and the light-emission signal. At the very beginning we located the active region, given that thermal expansion could be observed on the active region. Next, since Lift mode height is within near field of active region, it was possible to generate a map of the near field light-emission. It has been observed that changes of injection current resulted in alterations in the distribution of light emission.