An Initiation Mechanism of Thermal Instability of A Metal-Diamond-Vacuum Field Emission Regime

NS Xu,ZX Yu,SZ Deng,J Chen,SS Wu
DOI: https://doi.org/10.1063/1.125121
IF: 4
1999-01-01
Applied Physics Letters
Abstract:An analysis is carried out of the physical origin of thermal instability that can trigger a catastrophic vacuum breakdown event in vacuum microelectronic devices based on flat diamond emitters. The temperature rise in a diamond film will enhance internal field emission across metal–diamond interface. This effect can lead to a regenerative process that can initiate a breakdown event at temperature lower than the melting point of an emitter. A set of equations has been developed. These theoretical findings are successfully applied to explain the instability of field emission from the nondoped diamond films.
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