Abstract:Confined microexplosions induced in silicon by powerful ultrashort laser pulses can lead to new Si phases. Some of these have not previously been observed via near-equilibrium compression of silicon. In this study, confocal Raman micro-spectroscopy and Raman imaging of arrays of microexplosions have been conducted to search for Raman signatures of these novel allotropes of silicon. A microexplosion is generated at the interface between a thick silicon dioxide confinement layer and underlying silicon. It is characterised by a void at the interface above a region of compressed silicon. Raman data show a rich assembly of silicon phases within the modified silicon. Residual stresses up to 4.5 GPa in the modifications have been determined from the shift in the main diamond-cubic Si Raman peak. The computed Raman spectra for a number of Si allotropes show reasonable agreement with the experimental spectra. Two structurally similar tetragonal phases of silicon (the rhombohedral r8 and the body-centred bc8) phases as well as recently identified bt8-Si are all highly likely to be contained in Raman spectra from many laser-modified sites. Although the st12-Si phase, previously observed in our electron diffraction studies of the highly compressively stressed laser-modified regions, was not reliably identified from Raman data, we suggest this could be due to the possible difference in residual stress level in the sites analysed by the electron diffraction and Raman spectra. Several other unidentified Raman peaks were observed, suggesting the presence of other unknown silicon phases. All of these silicon phases are expected to have attractive semiconducting properties including narrow band gap that open up novel applications.

Research of optically excited and interrogated silicon resonators

The Optical Excitation of Silicon Microresonator

Relationship between silicon micromechanical resonators and excited point

Discussion on the optical-coupling in silicon optical-type micromechanical sensors

A Novel Structure of All-Optical Type Silicon Microresonator

The Research on Optically Excited Silicon Resonators

Thermally Excited Micromechanical Vacuum Resonator

Resonant Optical Properties of Crystalline Silicon Nanoparticles Fabricated by Laser Ablation-Based Methods

On-Chip Integrated Interrogator Based on Silicon Microring Resonator

Micro-Raman spectroscopy of ultrashort laser induced microexplosion sites in silicon

Time-Resolved Micro-Raman Stress Spectroscopy for Single-Crystal Silicon Resonators Using a MEMS Optical Chopper

In-Situ Study of Dynamics of Refractive Index Changes in Silicon Devices Induced by UV-light Irradiation

Low-threshold Raman Laser from an On-Chip, High-Q, Polymer-Coated Microcavity.

Silicon Nanophotonic Devices Based on Resonance Enhancement

Stimulated optomechanical excitation of surface acoustic waves in a microdevice

Angle-Resolved Intensity of In-Axis/Off-Axis Polarized Micro-Raman Spectroscopy for Monocrystalline Silicon

Single-particle vibrational spectroscopy using optical microresonators

Excitation of the electronic subsystem of silicon by femtosecond laser irradiation

Sub-wavelength Ripple Formation on Silicon Induced by Femtosecond Laser Radiation

Silicon-Based Stress-Coupled Optical Racetrack Resonators for Seismic Prospecting

Raman laser from an optical resonator with a grafted single molecule monolayer