Abstract:Synthetic aperture interferometry (SAI) is a signal processing technique that mixes the signals collected by pairs of elementary antennas to obtain high-resolution images with the aid of a computer. This note aims at studying the effects of the distance between the synthetic aperture interferometer and an observed scene with respect to the size of the antenna array onto the imaging capabilities of the instrument. Far-field conditions and near-field ones are compared from an algebraic perspective with the aid of simulations conducted at microwave frequencies with the Microwave Imaging Radiometer by Aperture Synthesis (MIRAS) onboard the Soil Moisture and Ocean Salinity (SMOS) mission. Although in both cases the signals kept by pairs of elementary antennas are cross-correlated to obtain complex visibilities, there are several differences that deserve attention at the modeling level, as well as at the imaging one. These particularities are clearly identified, and they are all taken into account in this study: near-field imaging is investigated with spherical waves, without neglecting any terms, whereas far-field imaging approximation is considered with plane waves according to the Van–Citter Zernike theorem. From an algebraic point of view, although the corresponding modeling matrices are both rank-deficient, we explain why the singular value distributions of these matrices are different. It is also shown how the angular synthesized point-spread function of the antenna array, whose shape varies with the distance to the instrument, can be helpful for estimating the boundary between the Fresnel region and the Fraunhofer one. Finally, whatever the region concerned by the aperture synthesis operation, it is shown that the imaging capabilities and the performances in the near-field and far-field regions are almost the same, provided the appropriate modeling matrix is taken into account.

Near-field optical scanning interferometric apertureless microscopy

Laser scanning saturated structured illumination microscopy based on phase modulation

Image Scanning Difference Microscopy

Widefield and total internal reflection fluorescent structured illumination microscopy with scanning galvo mirrors.

Scanning Near-field Optical Microscope and Application

Design and Applications of a Multi-Mode Scanning Near-Field Optical Microscope

Interferometric Measurement of Freeform Surfaces Using Irregular Subaperture Stitching

Far-Field Super-Resolution Imaging Using Near-Field Illumination by Micro-Fiber

Detection of optical field by near-field scanning optical microscopy

Super-Resolution Optical Microscopic Imaging Method Based on Annular Illumination with High Numerical Aperture

High Spatial and Temporal Resolution Synthetic Aperture Phase Microscopy.

Near-field imaging beyond the probe aperture limit

Near-Field Scanning Optical Microscope In Biological Research

Synthetic aperture interference light (SAIL) microscopy for high-throughput label-free imaging

A Comprehensive Comparison of Far-Field and Near-Field Imaging Radiometry in Synthetic Aperture Interferometry

A NEW PASSIVE CODING IMAGING METHOD IN SYNTHETIC APERTURE INTERFEROMETRIC RADIOMETER

Development and Application of Near-Field Optical Microscopy

Near-field Raman Spectral Measurement of Monocrystalline Silicon by Apertureless SNOM in Feflection Geometry

Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research

Low-cost single-shot complex optical field imaging with a simplified aperture

Theory and system of Forbidden Light near-field optical microscope