Fast algorithm for the parameter extraction of multilayered multiconductor interconnections. Finite difference-measured equation of invariance method

Wei Hong,ZhengHai Zhu,W. M Dai Wagne
1997-01-01
Tien Tzu Hsueh Pao/Acta Electronica Sinica
Abstract:The measured equation of invariance (MEI) method is used to calculate the capacitance and inductance matrices of the multilayered multiconductor interconnections. Because of the introduction of the measuring loop, the deduction of Green's function in multilayered multiconductor structure and the calculation of Sommerfeld type integrals are avoided. At the same time, the postulate of specific geometry in the conventional MEI method is canceled. Numerical results show that the new algorithm in this paper is correct and faster than common methods such as MoM, BEM, FEM, etc. It is also a very flexible method and can be used to analyze the interconnections with arbitrary shape and loss conductors. Therefore it is an ideal method for the parameter extraction. Based upon the capacitance and inductance matrices, the transient response of an interconnection terminated in nonlinear loads has also been calculated.
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